Mighty EBIC

Installation on an FEI DB235

This is our test socket and stage for DIP mounted samples installed in a FEI DB235

Evolution of the local potential profile in Schottky-contacted Ge nanowires

The first publication being submitted with EBIC data taken with our initial prototype.  We are very excited about this and we are  now working on using EBIC inside a FEI DB 235.  Our official announcement of our MIGHTY EBIC system will be out by the end of the week.

Writing Content

In a week or so we are announcing our premiere product(s), the Mighty series of tools. The Mighty line of products consists of the Mighty EBIC Controller, and the software and hardware testing tools that go with it. The Mighty EBIC will make it easier and faster to do Electric Beam Induced Current (EBIC) measurements a nearly any Scanning Electron Microscope (SEM) out there. We have some great features that make Functional Imaging a lot easier to do, and a lot easier to analyze the data from those experiments.

For now, we are going to hold our cards a few more days as we polish our product information, and fill in the last bits of details. Our official product announcement will go out soon, and we plan to ship the first units this fall.

About Ephemeron Labs

This is the new and updated site for Ephemeron Labs. Ephemeron Labs was founded in late 2009 by Terrence McGuckin and Far McKon as an engineering firm dedicated to doing more with less. Our initial product offerings are the Mighty EBIC and EBIC Test Socket & Stage.

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